Demonstration of the first 9.2 kV 4H-SiC bipolar junction transistor

نویسندگان

  • J. Zhang
  • P. Alexandrov
  • T. Burke
  • J. H. Zhao
چکیده

– This paper reports the first demonstration of a 9.2kV 4H-SiC bipolar junction transistor (BJT) based on a 50 μm, 7x10cm doped drift layer, achieving an emitter current density of 150A/cm at VCEO=5V. A much larger area BJT of identical wafer design with negligible current spreading effect would have an RSP_ON equal to 49mΩ-cm limited only by the specific resistance of the 50um drift layer. A DC common emitter current gain of 7 is achieved.

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تاریخ انتشار 2012